Used SOLVISION AV-6010T #9148601 for sale

SOLVISION AV-6010T is a wafer testing and metrology equipment designed to detect and analyze defects on semiconductor wafers. With a high degree of accuracy and speed, the system is capable of detecting small imperfections, crystals, and particles on wafer surfaces. Additionally, the unit can measure wafer thickness, ellipsometry and electrical properties. AV-6010T features two scanning options - both close range (1-500x) and ultra-high magnification (500 -30,000x). Close range scanning enables users to observe surface details, while ultra-high magnification scanning is ideal for pinpointing contaminants and minute particle defects. To ensure accuracy, the machine integrates a variety of technologies including scanning electron microscope (SEM), atomic force microscope (AFM), laser Doppler velocimetry (LDV), spectroscopy (Raman, FTIR, and VIS), and monochromator. In addition to defect detection and analysis, SOLVISION AV-6010T can measure wafer thickness using both contact and non-contact profiles. Measuring a wide range of substrates from fragile crystals to rigid materials, the tool accurately measures from 20nm to 600uM. Additionally, the asset supports several measurement techniques including spectroscopic ellipsometry and surface electrical properties. The model also integrates with third-party software, allowing users to control and transfer data. All control and measurements are managed from a single touch interface. The easy-to-use interface enables quick setup and tasks to be completed in as little as 10 minutes. Overall, AV-6010T is a comprehensive and reliable equipment specifically designed to detect, measure, and analyze wafer defects. With a range of options and features, the system can handle different types of applications with precision and speed. Furthermore, the easy-to-use interface makes data transfer and control effortless, providing users with a smooth user experience.