Used SONOPLOT GIX Microplotter II #9247999 for sale

SONOPLOT GIX Microplotter II is a multifunctional wafer testing and metrology equipment specifically designed for advanced technology applications where sophisticated analysis and robust performance is needed. It provides complete testing and metrology capabilities such as multi-sample/site wafer testing, film thickness/depth measurements, overlay measurements, complete die boundaries/capacitance measurements and multiple areas of failure analysis. GIX Microplotter II boasts a powerful oscilloscope/spectrometer system which consists of four channels for simultaneous measurements and a wide bandwidth of up to 200 MHz. It also features a wide range of test and analysis capabilities, from basic AFM microscopy to advanced metrology applications. It offers wide dynamic range and high speed for accurate capture and analysis of fine details on small samples. By combining SONOPLOT GIX Microplotter II with advanced software, users can achieve ultra-fast data processing, live imaging in the sub-micron range, and comprehensive surface measurements. In addition, GIX Microplotter II is fully automated with its advanced "smart" control technology. This allows for a fully automated unit to perform all test procedures in under four hours with up to 99% accuracy. The machine also incorporates a wide range of user-friendly features, such as an online help menu and a comprehensive library of pre-defined test templates. Advanced security measures are also included for enhanced safety and reliability. SONOPLOT GIX Microplotter II is a powerful tool for conducting complex measurements and automated testing procedures. Its multi-channel oscilloscope/spectrometer tool, wide bandwidth capabilities, and ultra-fast data processing allow it to provide accurate and reliable data for metrology applications. Its fully automated, "smart" control technology and sophisticated software also provide users with an unparalleled level of convenience, safety, and performance. GIX Microplotter II is perfectly suited for sophisticated measurements in wafer applied technology, making it an essential tool in the development of advanced technology components.