Used SONOPLOT GIX Microplotter #9280326 for sale

SONOPLOT GIX Microplotter is a wafer testing and metrology equipment created by SONOPLOT, a market leader in automated thin film metrology. It is designed to measure the thickness and optical parameters of thin-film layers deposited on top of each other in the form of a wafer stack with high accuracy. It can analyze both dielectric and metal materials, providing results with nanometer precision. The instrument consists of two subsystems. The first subsystem is the prismatic optical head which houses the optical imaging system, the measurements source, the scanning motion unit, and the following optics. The second subsystem is the electronics. The electronics are intended to acquire the data from the optical head, process the information, and apply filters to the output. GIX Microplotter is also equipped with auto-levels and focus corrections to ensure accurate results regardless of surface variances. It simultaneously measures films in contact mode and in air without having to switch out components. Users can control the machine through the Windows-based GUI, which provides full control over the tool's functions and parameters, as well as the ability to save the geographical data to a file. Lastly, the asset comes with various software packages such as PRISM, SCENE, and DISC 2. These software packages help process the data and create comprehensive reports. Overall, SONOPLOT GIX Microplotter is an advanced wafer testing and metrology model designed for measuring the accuracy of thin-film layers. It is accurate, reliable, and easy to use, making it an ideal choice for those working with highly sensitive thin-film layer materials.