Used SONOPLOT GIX Microplotter #9303841 for sale

SONOPLOT GIX Microplotter is a top-of-the-line wafer testing and metrology system which is used to measure the electrical and physical properties of semiconductor wafer material. This system utilizes a variety of technologies, such as scanning electron microscopy (SEM), focused ion beam (FIB), laser scribing, infrared (IR) imaging, optical spectroscopy, and atomic force microscopy (AFM). GIX Microplotter is able to take extremely high-resolution images of the surface of the wafer material. This is achieved by scanning each individual wafer while two lasers simultaneously scan across the surface. This allows for a precise level of detail and accuracy, which is necessary to accurately measure the properties of the wafer material. Additionally, SONOPLOT GIX Microplotter is capable of areas of less than 10 microns, allowing for the measurement of extremely small features. Further, GIX Microplotter is equipped with advanced FIB capabilities, allowing for the deposition and removal of material on the wafer surface. This is a vital tool in wafer testing and metrology, as it allows for the precise control of the surface features for accurate testing of the wafer material. Additionally, SONOPLOT GIX Microplotter is able to perform milling and point of contact testing in order to measure electrical properties. GIX Microplotter has also been enhanced with a software package to simplify testing procedures. This GUI-based software provides a nice and easy-to-use interface which allows for a variety of parameters to be inputted. These parameters can then be programmed into the machine, and the machine will acquire the data based on these parameters and guidelines. This feature alone significantly simplifies wafer testing and metrology. Overall, SONOPLOT GIX Microplotter is a highly advanced wafer testing and metrology system which provides an unprecedented level of accuracy and precision. It is equipped with a wide array of features, ranging from high-resolution imaging to FIB capabilities, and its software-driven GUI simplifies the process for the user. With GIX Microplotter, you can have confidence that you are accurately and reliably measuring the properties of your wafer material.