Used SSM 150 SRP #96656 for sale

SSM 150 SRP is a sophisticated wafer testing and metrology equipment designed for quickly and accurately gathering high-level statistical information about the physical and electrical properties of a wafer. The system features a high-performance scanning electron microscope with a built-in multi-channel spectrometer, allowing accurate imaging and chemical analysis in a single operation. The unit's combination of powerful hardware, software and its unique imaging technology enables simultaneous scanning of up to 1000 sites per wafer with a resolution down to 50 nm. It enables users to measure the exact physical parameters of the scanned area, including its composition, surface topography and defects, as well as the electrical properties, such as sheet resistance and leakage current. This information is used to create a detailed description of each wafer's performance and optimize processes to facilitate greater efficiency and yield. Furthermore, the machine is equipped with a proprietary auto focus algorithm which maintains imaging quality despite different wafer curvature and contamination, significantly increasing the accuracy and reliability of the results. Additionally, the integrated multi-channel spectrometer enables the collection of critical spectral data from the electron beam. The spectral information from the electron beam can be used to build an atomic-level picture of what's happening down at the atomic level, including element composition and defect characterization. 150 SRP is capable of operating under high vacuum and has an integrated cooling tool for longer operational periods, improving the reliability and repeatability of the tests. Furthermore, it features a fast data acquisition rate, a intuitive and user-friendly interface and includes optional external components, such as probes and manipulators, to further expand the device's testing capabilities. Overall, SSM 150 SRP is a reliable and versatile wafer testing and metrology asset that can quickly and accurately gather high-level statistical information. Its capabilities enable users to test a wide variety of materials and devices, allowing them to optimize processes and improve yields.