Used SSM 490i #9407979 for sale

SSM 490i wafer testing and metrology equipment is an integrated tool for non-invasive testing and metrology of semiconductor devices and materials. The system combines optical metrology and COTS-based sensors to provide a comprehensive analysis of wafer materials, with high precision and accuracy to test each wafer's dimensions, stress, and properties. 490i is suitable for testing and metrology applications ranging from process-efficiency measurements and detector- threshold testing to material identification and characterization. The unit includes advanced optical metrology technology that is used to measure and inspect wafers at nanometer resolutions with an accuracy of less than one nanometer. This nano-resolution metrology measurement enables researchers to quantify the effect of physical and chemical processes on the wafer's thin layers of material. Additionally, the machine can measure the stress of the individual thin layers on the wafer. SSM 490i's COTS-based sensors can determine a wafer's critical dimensions; this non-invasive method is very beneficial in device characterization and production of high-reliability, cost-effective devices. The tool's advanced imaging capabilities also enable high-resolution imaging to detect defects and monitor process yields. It can provide a detailed characterization of the surface texture and roughness of a wafer over its entire diameter. 490i is designed for accuracy and reliability, reducing the time required to collect data. This asset uses an automated data collection to simplify and speed up the test and measurement process by quickly inferring the results of several measurement parameters. Additionally, the model includes a substrate holder that allows it to measure wafer thicknesses of up to 15 millimeters with an accuracy of less than five nanometers. SSM 490i wafer testing and metrology equipment is an advanced tool for a variety of test and measurement applications. Its optical metrology and COTS- based sensors enable device testing and materials characterization with high precision, accuracy, and speed. It is designed for reliability and efficiency to achieve a high-quality process yield and reduce time to market.