Used SSM 495 CV #9113629 for sale

SSM 495 CV is a wafer testing and metrology equipment designed to provide precise measurements for integrated circuit (IC) structure and device parameters. This system offers accurate and efficient wafer testing and metrology to support process development and production control. 495 CV consists of a high resolution optical microscope and a scanning electron microscope. The unit contains two independent operating units, the first being a measurements and control unit, and the second being the wafer preparation unit. The measurements and control unit allows for the evaluation of wafer surface conditions, including IC structure, device parameters, and defect analysis, for both dynamic and static testing. The wafer preparation unit supports pre-measurement surface preparation and post-processing tasks, such as sputter cleaning. The machine features powerful software to control the microscope, providing a range of tools that allow for accurate measurements and a library of algorithms for device parameter analysis. A powerful image analysis package is also included in the software, allowing for enhanced image manipulation and image processing for wafer device testing and device performance analysis. The tool offers an array of metrology tools including voltage-variable capacitance, atomic force microscopy (AFM), conductivity imaging, multi-beam photomasks, and in-asset optical profilometry. The model also offers spectral imaging for micro-CT imaging, allowing 3D imaging of internal structures of samples. SSM 495 CV is equipped with an advanced user interface that is easy to navigate. The user interface is designed to provide enhanced user experience and enable automatic operation. Through the use of a variety of advanced metrology tools, the equipment can provide accurate and precise measurements for IC structure and device parameter analysis. Additionally, the system provides a wide range of features and tools that support wafer surface preparation and post-processing tasks.