Used SSM 495 #293796070 for sale

SSM 495 is a wafer testing and metrology equipment designed for use in microelectronic fabrication facilities. The system features a combination of subsystems for wafer inspection, metrology and process monitoring. For wafer inspection, the unit includes high-resolution imaging capabilities, as well as defect review and classification capabilities. This allows users to quickly identify and classify wafer defects, as well as providing a triggering mechanism for defect sinks. The machine also incorporates scanning electron microscopy (SEM) and focused ion beam (FIB) imaging capabilities, allowing the user to examine the defects at a detailed level. For metrology, the tool provides a number of different types of measurements, which can be used to evaluate the electrical, mechanical and optical properties of the wafers. This includes electrical properties such as resistance, capacitance and power, as well as optical properties such as reflectivity, absorption and transmission. It also includes features for automated wafer geometrical measurements such as height, distance and width. The asset also includes a range of image characterization and analysis tools to provide further insight into the wafer characteristics. Finally, the model includes a number of specific process monitoring features, including real-time measurement of wafer temperature, wafer structural parameters, as well as equipment performance monitoring. This allows users to ensure optimum process conditions are being met, and to quickly identify deviations from the desired values. The equipment can also be coupled with offline process data analysis to assess various process parameters and metrics over time. Overall, 495 provides an integrated system for analyzing and characterizing wafers, allowing users to quickly and accurately identify process defects and potential solutions. The comprehensive range of imaging, metrology and process monitoring capabilities offer broad flexibility and optimization, enabling users to maximize wafer yield in their production environment.