Used SSM / SOLID STATE MEASUREMENTS 470i #9412433 for sale

SSM / SOLID STATE MEASUREMENTS 470i Wafer Testing and Metrology equipment is an advanced tool for metrology testing of integrated circuits, MEMS components and wafer-level packaging. It combines sub-nanometer resolution automated optical, scanning electron microscope (SEM) and micro-manipulation capabilities with cutting-edge pattern recognition and data analysis technology. By combining these features, the system provides the most comprehensive platform for conducting fast and accurate analysis of a variety of semiconductor materials and devices. SSM 470i is designed with a large wafer handling area which allows for many wafer positions, scan area, and sample orientation. The unit is also equipped with an automated focusing element which can be programmed to give precise focus to each of the samples, enabling resolution of features as small as 0.5 microns. An integrated 7 megapixel digital color camera further enhances the machine's ability to capture data, while the automated membrane alignment feature helps to ensure accurate measurements in all directions. SOLID STATE MEASUREMENTS 470i is equipped with a series of automated measurement tools that allow for precise wafer measuring and metrology operations. These tools enable accurate measurement of critical physical characteristics of the wafer including integral feature size, surface roughness, optical flatness, and electron beam resolution. The tool's software also includes advanced optical data analysis algorithms, which analyze the raw data for precise non-contact height measurements. For precise in-plane element metrology, 470i asset is complemented with a series of automated scanning probe microscope tools. These tools provide precise results for a variety of 2D, 3D and nano-scale measurements. The model also includes advanced pattern recognition algorithms, which facilitate precise elemental analysis of material samples. The highly precise optical and SEM measurements made by SSM / SOLID STATE MEASUREMENTS 470i give users the ability to analyze the performance of critical devices and components with unparalleled accuracy. By incorporating advanced micro-manipulation capabilities into its design, the equipment also helps to improve the accuracy of packaging and wafer-level probes. In summary, SSM 470i Wafer Testing and Metrology system is an advanced, comprehensive solution for accurately and quickly analyzing micro-scale features of integrated circuits and other semiconductor materials.