Used TAKAKI TBS-3011 #9352186 for sale

TAKAKI TBS-3011 is a top-of-the-line wafer testing and metrology equipment designed to meet the demands of semiconductor research and production. Its load port can handle up to 300mm (12-inch) wafers. With high-precision, high-speed vision systems and semi-autonomous capabilities, TBS-3011 can help streamline your semiconductor production process. Inspection and metrology are critical components in the semiconductor production process. TAKAKI TBS-3011 offers a full range of inspection and metrology capabilities to ensure the highest quality of end products. The flexible platform can detect particles, surface defects, and other process errors with high accuracy and resolution. Additionally, it can also inspect for moisture, oxidation, and other contamination that can affect the performance of semiconductor devices. TBS-3011 also features several advanced sensors for precise inspection needs. Its eddy current sensor can detect even the smallest cracks and fractures, while its capacitive sensors are useful for detecting surface anomalies. An image processing system can automatically inspect sample wafers quickly and accurately, and a built-in software package can help automate the process even further. For metrology needs, TAKAKI TBS-3011 is equipped with a suite of advanced technology to measure the shape and size of wafer patterns. It can measure pitch, bump count, line width, and step heights, as well as curvature, uniformity, overlay, and roundness. All measurements are precise and repeatable through the use of microphones, lasers, and optical sensors. TBS-3011 comes with all necessary hardware and software to start inspecting and metrologying samples as soon as they arrive. The unit provides intuitive operation with data analysis and export tools to ensure accurate and traceable processes. Furthermore, the robust and reliable machine can perform 24/7 without any manual intervention. In conclusion, TAKAKI TBS-3011 is a powerful and versatile wafer testing and metrology tool designed to meet the stringent demands of semiconductor research and production. With flexible inspection and metrology capabilities, high-precision measurements, and repeatable performance, it can save time and money in the production process while ensuring product quality.