Used TAYLOR HOBSON LASER 635 #293671747 for sale

TAYLOR HOBSON LASER 635 is a fully automated wafer testing and metrology equipment used in semiconductor fabrication. This system can meet the demands of both production and research environments, providing reliable and accurate measurement results. It comprises of a robust, stable, and precise semiautomatic wafer handling unit coupled with a high performance laser probe machine. The wafer testing and metrology tool is designed to measure a range of parameters on the wafer surface such as wafer stress, micro-strain, step heights, surface roughness, contact angles, 3D profile, scattering parameters, and others. The telescope-based probe asset is positioned at the axis of a vertical beam scanner for lower mechanical stress. The power of the laser source is set according to the user requirement. The control unit is integrated in a 19-inch rack with software defined rotary scanner and Z-stage. The user interface is intuitive and completely autonomous software is provided with the model for automated batch analysis. LASER 635 offers a variety of measurement capabilities, including voltage monitoring and laser focalization. It is suitable for measuring non-uniformity of nanoscale structures. The flexible design of the equipment offers complete flexibility for user-defined scan areas which makes it an ideal choice for wafer metrology applications. The system is fully compliant with the latest manufacturing process capabilities, enabling users to make meaningful process adjustments. TAYLOR HOBSON LASER 635 provides fast data analysis and easy-to-use software that simplifies the workflow. The intuitive and user-friendly GUI allows users to quickly access all of the information that they need during their analysis process. This makes the unit ideal for those who need to analyze large volumes of data in a short amount time. The automated scanning and batch analysis further reduces user time for more efficient research. LASER 635 offers superior performance, reliability, and accuracy. Ideal for research and production environment, this wafer testing and metrology machine provides users with high-quality results that can be used to make meaningful decisions on their process development and wafer manufacturing designs.