Used TAYLOR HOBSON Surtronic 3P CPO #9012791 for sale

TAYLOR HOBSON Surtronic 3P CPO (Coordinate Measuring Point) is a world-class wafer testing and metrology equipment used in semiconductor fabrication plants and laboratories world-wide. It is designed to measure the physical characteristics of wafers with sub-nanometer resolution, giving real-time, in-line results with excellent repeatability and accuracy. The system uses a stylus and laser stylus probes to assess the flatness, geometrical dimensions, critical dimension and surface roughness of the wafers. It employs a three-point contact unit for accurate and repeatable measurements. The contact is accurately positioned via a scale feedback machine managed by motion control electronics, and the tool detects any variation in the wafer shape using a different probe type. The asset also monitors the critical angle of the wafers, making it ideal for advanced semiconductor production processes which require tight control of angles and shapes. It is equipped with automated vision model for easy and accurate alignment of probes to the wafer, making setup and measurement of complex structures quick and efficient. The data from the measurement operations can be stored, managed and reported within the equipment for both analysis and traceability. Surtronic 3P CPO's flexible software suite also allows for custom programs and algorithms to be written to tailor the measurements to the individual user's needs. TAYLOR HOBSON provides excellent customer service and support, ensuring that all users get the maximum benefit of TAYLOR HOBSON Surtronic 3P CPO technology. It also provides technical training for the users to ensure that they are able to use the full range of the system's features and take advantage of its metrology capabilities.