Used THERMA-WAVE OP 2600 #9292608 for sale

THERMA-WAVE OP 2600 is a state-of-the-art wafer testing and metrology equipment designed to provide high-quality measurements for a wide range of applications. The system is suitable for testing both single and multiple wafers, and its advanced capabilities allow for precise characterization of both standard and advanced semiconductor devices. THERMA-WAVE OP-2600 features a fully automated wafer handling unit with a choice of auto or manual wafer alignment. The auto alignment ensures precise results, and the machine is capable of measuring up to 200 test points per wafer. The tool also offers a variety of high-speed detection and analysis tools, including optical microscopy, algebraic curve fitting and pattern recognition. For metrology applications, OP 2600 includes an integrated infrared spectrometer, which provides nanoscale resolution with an accuracy of ±1 nm. This allows the asset to accurately measure the thickness, density, and properties of the wafer, as well as to identify nanometer-scale contaminants and structural defects. In addition, OP-2600 includes a range of advanced software tools, including DataFlex, a data recording management model, and Seer, a visualization tool that enables users to analyze wafer samples with greater efficiency and accuracy. The equipment also supports Ethernet connectivity for remote control and monitoring. Overall, THERMA-WAVE OP 2600 is an advanced wafer testing and metrology system that offers a comprehensive range of measurement capabilities, including high speed detection and analysis, infrared spectroscopy, automated wafer handling and precision results. The unit is suitable for a variety of applications, from standard semiconductors to advanced materials, and its range of advanced software tools make it an ideal choice for precise characterization and testing.