Used THERMA-WAVE OP-3290DUV #293753713 for sale
URL successfully copied!
Tap to zoom
THERMA-WAVE OP-3290DUV equipment is designed for wafer testing and metrology. It is a powerful tool that enables manufacturers to accurately measure a wide variety of characteristics associated with semiconductor wafers. It offers the latest technological advancements in optical metrology, offering precise measurement of features such as wafer thickness, surface topography, and optical width. OP-3290DUV system features an advanced optical microscope, which enables users to inspect wafers without contacting them. The microscope is equipped with software that can digitally measure and record the wafer's topography, width, and other features. The measurement accuracy can be adjusted to 0.004 / pixel. Additionally, the unit includes an optical profilometer, which can detect surface features such as hillock and grain boundaries on the wafer. The machine is designed for use in a semiconductor fabrication environment, where THERMA-WAVE OP-3290DUV can be used to detect, measure, and analyze defects. Using its advanced imaging capabilities and software, the tool can detect particle, dopant redistribution, and other irregularities that would otherwise go unnoticed. Additionally, the asset features a 2D scanning capability, allowing users to quickly map the entire wafer surface in a single scan. The model also provides a non-contact measurement capability, allowing users to measure wafer structures without making contact with them. The built-in imaging and metrology software provides a variety of options for controlling how the user interacts with the wafer. This makes OP-3290DUV an efficient, cost-effective solution for wafer testing and metrology. In addition to its imaging and metrology capabilities, THERMA-WAVE OP-3290DUV equipment features an auto focus system. This feature allows for precise imaging of the wafer regardless of its spacing within the unit. The combination of both imaging and metrology capability make OP-3290DUV a powerful tool for wafer testing and metrology.
There are no reviews yet