Used THERMA WAVE OP #9192132 for sale

ID: 9192132
Film thickness measurement system.
THERMA WAVE OP is a powerful wafer testing and metrology equipment designed to perform non-contact inspections with high accuracy and repeatability. It offers a range of comprehensive analysis capabilities, such as defect detection, surface contamination analysis, temperature profiling, coating uniformity measurement, and more. The system features a large area of detection, giving it a wide field of view and allowing it to measure a larger area of test samples, making it suitable for a wide range of applications. In addition, an integrated camera and software help provide clear images of the sample, allowing more detailed analysis. OP's advanced imaging tools, such as infrared imaging, optical scatterometry, and scanning electron microscopy (SEM), allow for the identification and characterization of surface defects and contamination on a nanometer scale. The unit's measurement capabilities are further enhanced by its Thermal Wave Analyser (TWOR) software, which offers greater accuracy for temperature profiling and coating uniformity measurements. To ensure accuracy and reliability, THERMA WAVE OP machine is supported by a number of proprietary assessments, such as a two-dimensional defect detection algorithm, geometric analysis for defect characterization, noise detection for sub-pixel defects, and an automated procedure for contaminant identification. The tool is also equipped with an integrated data acquisition and control module, for comprehensive data acquisition and control. This ensures repeatable test results, and allows for comparison between samples in a fraction of the time of traditional methods. Overall, OP is a powerful, reliable, and versatile wafer testing and metrology asset, offering a comprehensive range of analysis capabilities. Its abilities to measure temperature, surface conditions, and defects make it suitable for many testing and measurement applications, offering accurate and consistent results.
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