Used THERMA-WAVE OPTIPROBE 5220I #9171337 for sale

THERMA-WAVE OPTIPROBE 5220I is a wafer testing and metrology equipment that combines leading-edge technologies including thermography, optical imaging, reflectometry, and surface capacitance to accurately and rapidly measure wafer characteristics. This system provides reliable measurements of wafer flatness, uniformity, thickness, reflectivity, topography, and capacitance, which are all essential factors in a chip manufacturing process. OPTIPROBE 5220I is a high-precision, multi-function device that allows rapid measurements of thin and thick wafers. Using its multi-coordinate motor control unit, this machine will accurately measure both thin and thick wafers up to a precision of 1 micron. Additionally, the high resolution optical microscopy tool provides three-dimensional images so that users can view and analyze topographic and optical properties with accuracy. The asset also features THERMA-WAVE patented thermography model which uses infrared imaging and technology to capture thermal data points on wafers and chips. This data is used to accurately measure thermal properties such as surface flatness, variation, and thinning. This equipment also allows for profiling of both thermally or optically induced features, as well as detection of micro defects. THERMA-WAVE OPTIPROBE 5220I is a complete system offering peak performance and accuracy. It includes quick-change modules for rapid calibration, precise wafer chuck control, and automatic thickness adjustment, as well as a data logging unit with multiple report formats to document key measurements. With its advanced capabilities, OPTIPROBE 5220I is the ideal solution for testing and analyzing wafer properties. Furthermore, the machine's integrated software makes it easy to operate, allowing users to quickly access the data they need for their process. This tool is a powerful and reliable tool for producing consistent and superior results in wafer testing and metrology.