Used THERMA-WAVE TP 400 #9299958 for sale

THERMA-WAVE TP 400 Wafer Testing and Metrology Equipment is a powerful and advanced field-ready system designed for dynamic testing in both wafer production and research environments. The tester offers high-precision, non-destructive wafer testing with its automated test program assistant. The unit is capable of testing temperature cyclic accuracy of wafers, as well as made-to-order hybrid parameters, making it an invaluable tool for research and quality control systems. The machine is designed to check for electrical, thermal and mechanical issues in wafers, offering users high sensitivity measurements and broad temperature ranges for testing. It is also capable of testing parameters related to the physical characteristics of the wafer's surface such as the mean wafer thickness, ideal interface temperature between the wafer and the test probe, and the force-carrying capacity of the wafer. THERMA-WAVE TP400 Wafer Testing and Metrology Tool comes equipped with a high-resolution liquid crystal display for easy readouts and an intuitive user interface that simplifies operation and allows users to quickly set up tests. The asset is designed to operate in either single- or multiple-wafer mode with up to 128 firings per wafer. The provided PC-based software facilitates quick test programming and data acquisition. TP 400 Wafer Testing and Metrology Model also features an expansive temperature range—it can perform tests from -40°C to +400°C, in increments of 0.1°C, and users can choose from three different programmable heating rates: 1, 3, or 5°C/min. Additionally, a variety of additional features make the equipment attractive for both research and industrial applications. These features include comprehensive data logging and reporting, closed-loop laser beam scanning, and a wide array of analysis techniques. Overall, TP400 Wafer Testing and Metrology System is an ideal unit for advanced wafer testing and measurement in both the research and production environments. Its comprehensive analysis capabilities, user-friendly interface, and comprehensive range of features make it ideal for research, development work, and quality control systems.