Used TOHO P-40H #9239648 for sale

TOHO P-40H is a next-generation wafer testing and metrology equipment from TOHO, a renowned Japanese technology giant. This powerful and flexible system is perfect for semiconductor wafer manufacturers that are looking for an efficient and very precise way to measure and evaluate products from the early stages in production. The unit was designed with the latest in measurement advancement technologies. Its cutting-edge design offers excellent accuracy and superior repeatability, making it the perfect choice for production line assurance and quality control. Featuring a multi-sensor design, it can capture a variety of wafer parameters, including critical geometrical features, surface topography, composition, and other related attributes with high accuracy. At the heart of the machine is the dynamic Motion Control Unit (MCU) that ensures seamless and dependable operation. The MCU uses a combination of hysteresis and PID feedback to control its motion for utmost precision. Furthermore, the tool includes precision optics that capture a sample's attributes using up to 4K resolution over a 100mm x 80mm sample size. P-40H features a state-of-the-art illumination asset that allows for precise measurement of low-contrast samples, enabling users to get accurate results without complicated config changes. On top of this, the model includes an intuitive software package for remote monitoring and quality analytics. With this, users can easily keep an eye on their equipment's performance, and make necessary adjustments on the go. Overall, TOHO P-40H system is a reliable and accurate solution for highly precise wafer testing and metrology. Its cutting-edge design and advanced technologies make it the perfect choice for quality control departments - providing fast and accurate analysis with minimal downtime.