Used TOHO TECHNOLOGY FLX 2320-S #293655605 for sale

TOHO TECHNOLOGY FLX 2320-S is a top-of-the-line wafer testing and metrology system that offers users quick, precise measurements and superior performance. It is best suited to applications that demand high measurement accuracy, including advanced wafer level test and process optimization for semiconductor device yields. FLX 2320-S integrates advanced metrology features and technologies to improve accuracy and efficiency in wafer testing. Its Integrated Wafer-level Testing (IWT) feature boasts excellent linearity and repeatability to handle a variety of challenging wafer test applications. It also features Detect and Identify (D&I), a unique measurement diagnostics technology that helps identify and resolve wafer test failed conditions. TOHO TECHNOLOGY FLX 2320-S also offers advanced automated alignment and high-resolution imaging capabilities that deliver improved alignment accuracy and defect classification accuracy, resulting in higher yields. It is equipped with beam optics, including a specialized and powerful laser light source, to achieve better sensitivity for measuring smaller features. The largest feature of FLX 2320-S is the high throughput that it can achieve. It is actively managed by a highly reliable, risk-averse programming language for automation, which optimizes testing time and increases reliability. Furthermore, it is also efficient in terms of measurement speed and repeatability, thanks to its superior data handling capabilities that enable quick access to measurement results. TOHO TECHNOLOGY FLX 2320-S also provides users with traceability and lifetime control data to keep records of all measurements, allowing for easy maintenance and long-term accuracy. It also has a powerful feature that eliminates any related calibration drift present in the system. This multi-functional and easy-to-use system is capable of handling the complex and often hard-to-measure wafers that are present in modern applications. The detailed and precise results that it can provide are invaluable for achieving high device yields. FLX 2320-S is the perfect choice for both very small and very large wafer test applications.