Used TOHO TECHNOLOGY FLX 2320-S #293830581 for sale

TOHO TECHNOLOGY FLX-2320-S is a next-generation wafer testing and metrology equipment that offers high-precision, high-speed, repeatability and integration performance. Designed for the most demanding applications, FLX-2320-S system includes a modular architecture that enables it to achieve resistance testing and imaging performance on both metallic and non-metallic surfaces. The unit also features integrated tooling for fast and accurate mapping of circuits and contains various parametric testing capabilities that enable high-accuracy and high-speed testing. The backbone of the machine is the FTF Controller (Friction Transfer Function Controller) which controls all of the measurement, processing, metrology and imaging capabilities of the tool. TOHO TECHNOLOGY FLX-2320-S can measure and scan wafer surfaces at high-speed using a tessellating array that automatically detects and collects surface information. This data is then analyzed to create detailed images of physical structures, with the measurement parameters which are set by the user. The asset can also perform in-line metrology operations on a wide variety of substrates. With integrated dual cameras and laser scanners, FLX-2320-S can measure small particles and other complex features such as pads, pits, and even sub-micron features. It features a multi-lens solution involving both LED and laser illumination which can provide reliable results even under small angles and high contrasts. TOHO TECHNOLOGY FLX-2320-S also works with a variety of software, allowing for complete integration and flexibility. This includes an intuitive, user-friendly graphical interface for control of the model in a single, unified environment. The software is scalable, allowing users to program from a library of preset options or to customize the setup for individual configurations. The equipment also has a modular design which allows for easy expansion, providing flexible expansion options including more tooling, additional scanning, and more powerful processing capabilities. FLX-2320-S is designed to meet the needs of companies requiring professional-grade metrology and imaging performance in the semiconductor and microelectronic industries. Robust and reliable in operation, TOHO TECHNOLOGY FLX-2320-S system offers top-of-the-line metrology, imaging and data analysis capabilities to ensure consistency and repeatability of results. With its high-quality components and superior performance, FLX-2320-S is an excellent choice for quality assurance, production, and process management tasks in the semiconductor and related industries.