Used TOKYO SEIMITSU E-MF1000-100 #9374930 for sale

TOKYO SEIMITSU E-MF1000-100 is a wafer testing and metrology equipment designed for high-precision measurement and evaluation of integrated circuits. The system offers an advanced wafer-level evaluation platform that uses SLAM (Structured Light Advanced Measurement) and high-accuracy stage positioning technology to quickly measure and analyze wafers. It can measure all of the important performance indicators of an integrated circuit, including electrical characteristics, physical dimensions, and electrical leakage. Its SLAM technology features a dual-axial laser unit, capable of measuring wide-ranging dimensions and conducting thorough visual inspection. The machine's high-speed optical measurement tool can measure multiple zones simultaneously, and has a fast reaction time of 0.8 ms. It also has automatic defect selection and robot-assisted wafer mapping technology, allowing it to accurately identify potential defects on wafers. The asset is equipped with a rotary table to enable low-vibration measurements and reliable part positioning. The fully automated robotics can move wafers and parts without human intervention. It can measure process parameters to ensure process optimization and repeatability, and identify any potential failures or defects. The model also has an advanced wafer loader capable of loading and unloading up to 15 wafers per hour, allowing it to process a large number of different types of wafers. It also features Real Time Mapping (RTM) and real-time reflection analysis, providing operators with real-time feedback about process conditions and providing full traceability. The equipment is capable of precise operations and is capable of measurements and evaluations in multiple units, including nanometers, micrometers, and microns. It also features a Z-axis protocol for the wafer, allowing multiple layers of process data and real-time feedback of any changes in the wafer layout and structure. Furthermore, the system is capable of data logging and plotting, providing a comprehensive view of the entire production process. This data can then be used to identify areas for improvement and optimize production processes and product quality. The unit also features a simple user interface, making it easy to use for operators. Overall, E-MF1000-100 is an advanced wafer testing and metrology machine designed for high-precision measurement and evaluation of integrated circuits. With its advanced robotic, imaging, and data analysis capabilities, the tool provides a comprehensive, high-precision view of the entire wafer production process. Its simple user interface, precise measurement and evaluation capabilities, and data logging and plotting features make it an ideal asset for high-precision wafer testing and metrology.