Used UNION OPTICAL THS-208 #9386074 for sale

UNION OPTICAL THS-208
ID: 9386074
Wafer thickness measurement system.
UNION OPTICAL THS-208 is a wafer testing and metrology equipment that provides a platform for efficient defect qualification and metrology in the semiconductor industry. This versatile wafer testing system features a full range of optical and electrical solutions for the development of high-yield ICs and the rapid de-embedding of non-defect related electrical failures. UNION OPTICAL THS 208 offers several automated testing and metrology tools, which enable efficient defect qualification and metrology on both 200mm and 300mm semiconductor wafers. THS-208 features an optical microscope that allows visualization of top- and bottom-side defects with high resolution. It also offers automated wafer mapping, which quickly identifies yield-related circuit malfunctions, and provides organizational data that can be used to pinpoint systemic issues. THS 208 is equipped with automated test handling capabilities and precise, high speed monitoring of test results. This unit is capable of capturing and transmitting data from multiple electrical test parameters in real time. In addition, UNION OPTICAL THS-208 has the ability to control and coordinate multiple devices on and off-site, providing data sharing and rapid test execution. It is also capable of rapidly extracting and analyzing chip data, which can be used in developing chip architectures, providing product insights, and understanding customer requirements. Lastly, this machine can be used for process optimization, allowing production environments to be readily optimized. Overall, UNION OPTICAL THS 208 is a wafer testing and metrology tool that provides users with efficient defect qualification and metrology solutions for both 200mm and 300mm wafers. This asset features an optical microscope, automated wafer mapping, automated test handling capabilities, high speed monitoring of test results, ability to control and coordinate multiple devices, and data extraction and analysis capabilities. This all-in-one wafer testing and metrology model is the ideal equipment for efficient defect qualification and metrology in the semiconductor industry.
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