Used VEECO / BRUKER / SLOAN DEKTAK 150 #293651562 for sale

VEECO / BRUKER / SLOAN DEKTAK 150 is an industry-leading wafer testing and metrology equipment, designed to accurately and reliably measure the thickness, composition, topography, resistivity and profile of wafers. VEECO DEKTAK 150 has a high magnification optical profiler, which makes it ideal for sub-micron level test and measurement. The system has a vertical range of 250 microns, a lateral range of 450 millimeters, a scan rate of 150 scans per minute and a resolution of 0.25 nanometer. It is capable of performing high speed measurements and can accurately measure the thickness of thin films and conductive layers. Moreover, SLOAN DEKTAK 150 is equipped with a variety of advanced features, such as a sample heating stage, which enables the unit to measure temperature-dependent samples as well as sample temperatures up to 500°C. It has a high-throughput, low-vibration design for better stability, which improves its accuracy and repeatability. The machine also comes with VEECO easy-to-use Smart Tech software that allows users to quickly configure and run automated tests with minimal setup time. With its versatile range of measurement programs and capabilities such as 2D and 3D mapping, automated wafer thickness tests, wafer surface roughness, topography imaging and more, BRUKER DEKTAK 150 is the perfect solution for quality assurance testing. DEKTAK 150 is versatile, user-friendly and highly accurate, making it ideal for various applications in the semiconductor industry. From electronic device design and production to device characterization, failure analysis, capacitance measurements and more, VEECO / BRUKER / SLOAN DEKTAK 150 is capable of measuring a variety of wafer properties to provide users with detailed reports. It also works well for research applications, ensuring quality and accuracy in results. Overall, VEECO DEKTAK 150 is a reliable and accurate metrology tool, providing users with detailed measurements for a variety of wafer-based tests and measurements. With an array of advanced features and high throughput, it ensures accurate and repeatable results for a variety of industrial and research applications.