Used VEECO / BRUKER / SLOAN DEKTAK 8 #293754273 for sale
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ID: 293754273
Profilometer
(2) Chambers
Roughness
Vertical resolution: 6.55 µm
3D Topography measurement
Stress and defects samples: 200 mm
Step height repeatability: 7.5 A Step
Sigma maximum sample thickness: 25.4 mm
No PC.
VEECO, SLOAN, and BRUKER are reputable companies known for their advanced technology solutions in the field of materials analysis and metrology. VEECO / BRUKER / SLOAN DEKTAK 8 is a sophisticated wafer testing and metrology equipment that combines the expertise and technologies of these three industry leaders to offer comprehensive and accurate solutions for measuring the surface profiles of semiconductor wafers and other thin film materials. One of the key components of VEECO DEKTAK 8 system is its proprietary stylus profiler technology, which provides highly precise measurements of surface roughness, step heights, and film thickness with sub-nanometer resolution. The advanced stylus profiler consists of a sharp diamond-tipped stylus that scans the surface of the sample, detecting even the smallest variations in height and topography. SLOAN DEKTAK 8 unit is equipped with multiple measurement modes and analysis capabilities to accommodate a wide range of sample types and measurement requirements. This versatility allows users to perform various metrology tasks, such as step height measurements, film thickness analysis, surface roughness characterization, and line width profiling, with high accuracy and repeatability. In addition to its advanced measurement capabilities, DEKTAK 8 machine features a user-friendly interface and intuitive software that streamline the measurement and analysis process. The software allows users to customize measurement parameters, data analysis settings, and reporting formats, making it easy to generate accurate and detailed metrology reports for research, development, and quality control purposes. BRUKER DEKTAK 8 tool also offers advanced automation features, such as motorized stage control, multiple sample positioning options, and batch measurement capabilities, which enhance productivity and efficiency in high-throughput testing environments. These automation features enable users to perform rapid and accurate measurements on multiple samples in a single run, reducing measurement time and increasing throughput. Another notable feature of VEECO / BRUKER / SLOAN DEKTAK 8 asset is its compatibility with a wide range of wafer sizes and materials, including silicon, III-V compounds, sapphire, glass, and polymers. This versatility makes the model suitable for a variety of applications in semiconductor manufacturing, materials research, thin film deposition, and other industries where precise surface profiling and metrology are essential. Overall, VEECO DEKTAK 8 wafer testing and metrology equipment represents a cutting-edge solution for accurate and reliable surface measurement and analysis. Its advanced technology, user-friendly interface, automation capabilities, and compatibility with various sample types make it a valuable tool for research and development, quality control, and process optimization in the semiconductor and materials science industries.
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