Used VEECO / BRUKER / SLOAN DEKTAK 8 #9291942 for sale

VEECO / BRUKER / SLOAN DEKTAK 8 is a high precision wafer testing and metrology equipment designed to help semiconductor manufacturers and nanotechnology researchers to accurately measure structures, layers, and features down to atomic scales. The system can measure wafer topography, micro-thickness, and other critical parameters with nanometer-level accuracy. The unit is equipped with a powerful optical machine for interferometric measurement and a large stage for multiple wafer inspection. It also has an integrated automatic and programmable probe positioning tool with an integrated motorized microscope for visual inspection. With this automated asset, users are able to precisely position probes anywhere on the sample, making it easy to measure multiple locations for a variety of die and wafer geometries. The automated model also allows for data acquisition rates up to 1000 Hz. The equipment's high accuracy and resolution come from its proprietary interferometry technology, which uses measurement of the optical interference between two beams of laser light. This allows it to take highly precise and accurate measurements that are repeatable and immune to environmental influences. VEECO DEKTAK 8 also has an array of integrated software features, including filtering, data collection, and analysis tools. It supports various metrology protocols, such as four-point optical thickness, depth map and primary plane contouring functions, allowing users to gather detailed and accurate information about the wafer's features. It also features a graphical user interface (GUI) to simplify operation and increase end-user data analysis. Overall, SLOAN DEKTAK 8 is a versatile and precise wafer testing and metrology system. With its automated and programmable probe positioning unit, interferometric technology, and integrated software, it provides users with accurate measurements of critical features down to the atomic level.