Used VEECO / BRUKER / SLOAN DEKTAK XT #293651886 for sale

VEECO / BRUKER / SLOAN DEKTAK XT is a wafer testing and metrology equipment designed to meet the needs of the semiconductor industry. The system operates on the principles of stylus profilometry, an advanced measurement technique for determining surface profile parameters on a wide range of materials. It enables 3D measurements of feature sizes, traceability to standards and allows for precision analysis of structure, shape, and profile. It uses computer analysis to make interactive graphs, statistical information and trend analysis. VEECO DEKTAK XT is designed for semiconductor wafers and thin film substrates. It features a large, high-resolution imaging unit housed in a compact case, making the device suitable for laboratory and production environments. Using a single stylus metrology head, SLOAN DEKTAK XT is capable of measuring up to two full wafers at an accuracy of ≤2.5 Å. It also features a pressure oscillator to measure very small features, such as 10um lines and spaces. The software included with DEKTAK XT is intuitive and user-friendly, with graphical display, point and click operation, database query, and search for patterns. It is compatible with multiple PC platforms and typically updated on a yearly basis. Its database can store up to 20,000 points of data or images, and is exportable in both text and graphical formats. BRUKER DEKTAK XT is a powerful and versatile wafer testing and metrology machine that offers accuracy and precision for nanoscale work. With its portable housing and easy-to-use software, it is well suited for both lab and production environments.