Used VEECO / BRUKER / SLOAN DEKTAK XT #293797519 for sale

VEECO / BRUKER / SLOAN DEKTAK XT is a wafer testing and metrology equipment designed for precision metrology of both semiconductor and MEMS devices. It offers an innovative design and combination of advanced technologies, such as laser beam scanning, capacitive sensing, and automated imaging, which sets it apart from other systems currently in the market. The system is powered by the latest in laser beam scanning technology, which works at the atomic level for high resolution and accuracy on device features. This laser technology is coupled with a combination of iterative electrical measurements and imaging to provide a comprehensive view of wafer characteristics. VEECO DEKTAK XT also features a large, easy-to-use capacitive sensing stylus that is able to accurately measure surface topology, roughness and profile information on a variety of wafer materials. This stylus design also allows for automation of multiple measurements to increase throughput. SLOAN DEKTAK XT also offers an integrated imaging unit that is designed to allow users to quickly and accurately analyze the surface morphology of a wafer. It provides a 10 micron resolution image of the samples, which can be used to calculate critical device parameters such as step heights, line widths and isolated feature sizes. Finally, this machine is able to accurately measure the flatness of a wafer to within 1 angstrom of tolerance. This is achieved using proprietary algorithms that are designed to compensate for any surface or structure imperfections. In conclusion, DEKTAK XT is an advanced wafer testing and metrology tool that provides precision measurements at the atomic level with features such as laser beam scanning, capacitive sensing, and automated imaging. This asset is ideal for users looking for a versatile and reliable solution for their wafer testing needs.