Used VEECO / BRUKER / SLOAN DEKTAK XT #9359011 for sale

VEECO / BRUKER / SLOAN DEKTAK XT is a wafer testing and metrology equipment, which is comprised of an automated motorized stage, a laser and video microscope, powerful vision coordinate system (VCS) software and a multi-sensor optical profilometer. The unit provides not only precise 2D surface and 3D process measurements, but also offers advanced capabilities such as automated overlay measurement, as well as advanced optical inspection, which can be used to analyze process and product quality. The multi-sensor VEECO DEKTAK XT is designed for a wide range of applications, including die-to-die and die-to-wafer measurements for semiconductor devices and integrated circuits, as well as 3D measurements of nano-aerial features. Using SLOAN DEKTAK XT, a user can greatly reduce the time necessary to perform accurate measurements of a wide variety of surface features, allowing for more efficient production of wafers and devices. DEKTAK XT consists of a one-micron resolution optical profilometer, which provides accurate and reliable 3D measurements; a proprietary software package, VCS; and a fully automated motorized stage. The motorized stage utilizes piezoelectric motion control and piezoresistive feedback technology to accurately position the sample within a reliable, repeatable and stable environment. The powerful VCS software package allows a user to perform simple or sophisticated calculations and data analyses, while a special tilting stage is also included to meet users' needs in measuring wafers with curved or non-even surfaces. BRUKER DEKTAK XT is highly capable of providing accurate and reliable 3D measurements, and is specially designed to perform automated overlay measurement. Using this machine, accurate overlay measurements are performed automatically and quickly, allowing for more efficient production of die-to-die and die-to-wafer products. The tool also offers fast and precise optical inspection, which is a powerful means of analyzing process and product quality. VEECO / BRUKER / SLOAN DEKTAK XT is an extremely versatile asset, perfect for the measurement and analysis of wafers and devices. Directions as small as 1 micron can be measured, and users have access to advanced capabilities such as automated overlay measurement. The intuitive and powerful VCS software allows for sophisticated data analysis, and the fully automated motorized stage provides increased precision and stability. All in all, VEECO DEKTAK XT is an accurate and reliable wafer testing and metrology model, ideal for a number of applications.