Used VEECO CXR-V #186444 for sale

VEECO CXR-V is a versatile wafer testing and metrology equipment designed for the semiconductor industry. It is a fully automated system that provides accurate, reliable, and repeatable surface evaluation of semiconductor devices. CXR-V utilizes non-contact sensing technology to measure the topography, physical shape, surface roughness, and other critical parameters of the wafer's surface. The unit includes a variety of applications such as reflectometry, microradiometry, capacitance measure, ellipsometry, and automated defect inspection. VEECO CXR-V's reflectometer is designed to provide accurate measurements of the film thickness, topography, stress, and composition of various materials. The measurements are then evaluated to determine the surface properties of the device. It also uses ellipsometry, a non-destructive optical technique, to quantify thin film properties. Ellipsometry can be used to measure the thickness and optical constants of materials and thin films. The machine includes a high accuracy capacitance measurement unit with a contact-less sensor, which measures the electrical parameters such as the sheet resistance and sheet carrier concentration of the device. This tool also includes a microradiometer, which is capable of measuring the micron-scale surface temperatures of samples with sub-micron accuracy. The asset supports automated defect inspection, which uses advanced algorithms to identify defect particles on the wafer surface. This can be used to quickly identify and evaluate potential defects while eliminating manual processes and eliminating operator error. The user interface allows for easy operation and monitoring of the performance of the model. CXR-V is designed for use in a wide variety of wafer testing and metrology applications, making it a cost-effective, high-performance solution for semiconductor manufacturers.