Used VEECO / DEKTAK 8000 #9328743 for sale

ID: 9328743
Profilometer.
VEECO / DEKTAK 8000 is a wafer testing and metrology equipment designed to provide precise measurement of the electrical characteristics of semi-conductor devices and materials. It offers integrated high accuracy testing and metrology solutions to optimize process yields and manufacturing efficiencies. VEECO 8000 uses advanced nanoscale analysis and imaging technology to perform non-destructive, on-the-fly measurements of patterned surfaces. It has integrated precision force feedback for better resolution, higher accuracy readings, and faster throughput. This system delivers higher quality results, improved product yield and lower cost. The integrated motorized stage allows for sample positioning accurate to within 0.05 microns. The built-in setable substrate mapping function and automatic alignment capability set DEKTAK 8000 apart from other systems. The large stage area (400 x 400 mm) accommodates various wafer sizes, and the wafer holder assembly options provide various approaches for high throughput production and automation. The refraction-based optical elements within the unit enable imaging from 0.07 µm to >400 µm. The range of vision is facilitated by the ability to view the sample surface topography at different heights, and with regards to two optical axes. These measurements can be used to detect the surface integrity of metallic and dielectric layers. 8000 also offers a variety of imaging capabilities including time-lapse studies and confocal microscopy. The integrated software provides real-time measurement data analysis, allowing concise statistical process control for enhanced process monitoring and performance. Overall, VEECO / DEKTAK 8000 is an integrated wafer testing and metrology machine offering high precision measurement of electrical characteristics of semi-conductors devices and materials. It features automated alignment and motorized stage, optical resolution from 0.07 µm to >400 µm and advanced imaging capabilities to determine surface integrity. The integrated software also provides real-time analysis of data for enhanced process monitoring and performance.
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