Used VEECO / DEKTAK V- 200 SL #9351732 for sale

VEECO / DEKTAK V200-SL is an highly advanced form of wafer testing and metrology equipment designed specifically for measuring thickness of semiconductor wafers. It offers fast, accurate, and reliable measurements in a simple and user friendly interface, making it a reliable solution for virtually any wafer manufacturing environment. VEECO V200-SL is a vertical scanning system that is capable of measuring wafers with diameters up to 300 mm. It features three independent, interchangeable optical heads which can be configured to measure each wafer's individual thickness profile. This enables the unit to accurately measure up to two thousand different points of a single wafer. As each head is able to measure different variables, allowing the user to customize the measurements depending on the specific requirements. DEKTAK V200-SL utilizes a high quality optical wafer mapping machine, which provides a clear and precise picture of the surface structure and topography of a wafer. This tool also includes an optimized automated data acquisition feature with real-time filtering capabilities, which helps to reduce errors in measurements. The asset boasts a fully automated model that is capable of performing multiple tests and measurements on multiple wafers quickly and accurately. This helps to reduce the time that a single wafer must be tested for, resulting in overall cost and production efficiency. The user friendly graphical interface allows for quick setup and processing of test data, as well as for measuring, analyzing, and displaying the output. V200-SL produces a clear and detailed report of the thickness measurement that is generated from the data acquired from a specific wafer. It also includes an on-board database that stores all previous data and allows users to recall data whenever needed. VEECO / DEKTAK V200-SL is a reliable and efficient wafer testing and metrology equipment, ideal for any manufacturing environment. Its highly advanced features, versatility, and user friendly interface make it the ideal choice for any wafer manufacturer requiring accuracy and precision in their measurements. Its compatibility to a wide range of components makes it the perfect solution for any wafer measuring application.