Used VEECO / DEKTAK V- 300 SL #293634653 for sale

VEECO / DEKTAK V- 300 SL is a state of the art wafer testing and metrology equipment designed for use in semiconductor and solar device testing, characterizing and metrology operations. This system is designed to provide fast and accurate measurements as well as robust data collection and analysis in a portable, low-cost package. VEECO V 300SL features a large 13.3" LCD display and advanced optical and scanning sensors. These sensors provide automated 3-D and 2-D measurements over the entire wafer surface area, with results presented in real-time. The unit comes with a powerful, proprietary software platform built with the latest coding languages, allowing users to easily set up and customize testing protocols. DEKTAK V300-SL utilizes a High-Originality Point of View (HOPOV) free-inertia scanning stage. This light weight, high-performance device features dual-cross-sectional and single-cross-sectional stages for automated plane-view and high-resolution surface profiling. The plane-view stage offers 600 axes of freedom, with a scanning range of 50 μm and a measurement accuracy of 0.5 μm. The high-resolution stage offers up to 1.8 μm accuracy and 8 µm lateral resolution. These stages are optimized for use with a range of substrate materials, and work in sync with the machine's 3-D ultra-sonic scanning capabilities. The tool can be easily configured with one or more optical and scanning sensors including 2D Laser (non-invasive) and 4D-Laser (invasive) scanners, 3D-sonic scanning, and Raman and Scanning Electron Microscope (SEM) scanners. Together with these sensors, the asset also encompasses a range of other high-precision measuring and measurement support systems, such as two axis auto-mounts, wafer-level mapping and focus monitoring. Connectivity is easy and comprehensive. With Wi-Fi and Ethernet capability, DEKTAK V 300SL can be hooked up to external networks, allowing access to outputs, logic boards and other equipment. Additionally, a range of post-processing options are included, such as data acquisition, sorting, data visualization and autonomous decision making support software. VEECO / DEKTAK V 300SL is an incredibly versatile and powerful wafer testing and metrology model. Its combination of advanced optical and scanning capabilities and post-processing support is unparalleled in its class. This equipment is designed for speed, accuracy and reliability, making it the perfect option for laboratories, research and development departments and larger corporate enterprises.