Used VEECO / DEKTAK V 300Si #293585852 for sale

ID: 293585852
Surface profilometer Axis control card non-functional Power supply: 240 VAC, 3 A.
VEECO / DEKTAK V 300Si is a wafer testing and metrology equipment, designed to provide accurate, repeatable measurements and advanced process control, in a compact form factor. This system is suitable for a wide range of laboratory and production testing environments, from small research facilities to large industrial sites. The unit features a fully integrated, contactless, 3-axial metrology machine, combined with a light-weight, rigid, closed-loop XYZ stage for measuring samples up to 300 mm in diameter. The contactless metrology tool uses advanced laser triangulation technology, which allows for high precision, low noise, and linear repeatability measurement over largeΔzactuations. This asset also features a unique dual-axis stage for high-accuracy tilt-and-rotation measurements of sample surfaces. For wafer testing, VEECO V-300SI incorporates a mechanical wafer probe model, which allows for non-destructive testing and measurement of wafers up to 12 inches in diameter. This equipment has a back-illuminated calibration system that provides high-contrast images and can accurately measure surface roughness, surface height, and optical parameters such as reflectance, backscatter, and homogeneity. For advanced process control and analysis, DEKTAK V-300 SI uses advanced algorithms to identify sample surface features and map critical parameters such as line-width and space-width, critical dimension, and non-uniformities. This unit also includes a unique drift-correction algorithm, which can compensate for any small changes in wafer flatness over time. In terms of user-interface, VEECO / DEKTAK V-300 SI features intuitive, easy-to-use software with graphical decision services and automated data analysis. It also comes with a variety of programming languages and APIs, which allow users to customize their testing environment and maximize the machine's capabilities. Overall, DEKTAK V 300Si is an advanced wafer testing and metrology tool, designed to provide accurate, repeatable measurements and advanced process control, in a compact form factor. With its unique contactless metrology asset and advanced analysis algorithms, this model is perfect for a wide range of laboratory and production testing environments.
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