Used VEECO V200-Si #9234710 for sale

VEECO V200-Si is a wafer testing and metrology equipment designed to enable fast, repeatable measurements on small or large wafers. VEECO V 200SI system features an integrated metrology platform that combines proven optical and electrical technologies for processing wafers with several 300mm and 200mm configurations. It offers industry-leading process and test capabilities for semiconductor, MEMS, LED, and other thin-film applications. V200 SI unit features a 2-axis wafer stage with a metrology motion range of 6mm in x-direction and 20mm in y-direction, allowing for optimal wafer positioning. Its high-precision optical alignment machine is designed for fast and repeatable wafer location and measurements. VEECO V200 SI also has a fast laser autofocus mechanism for ensuring consistent wafer print performance. V200-Si features a host of combined metrology and test combinations, with options for stand-alone use or multi-station integration into test/probe platforms. It has interferometers used to precisely measure magnified images for accurate thickness and height measurements of thin-film layers. It also offers electrical testing capability with a 4-point probe tool for measuring electrical properties of diodes, transistors, and other microelectronic structures. V- 200 SI asset is custom-designed for a wide variety of process/test conditions. Its optimal air-tight environment eliminates external contamination during testing and measurement processes. It also offers closed-loop thermal control capabilities, featuring customized heating/cooling rates for precision temperature control. DEKTAK V-200 SI provides a powerful automation capability with its intuitive user interface for setting up, monitoring, and controlling the test/probe processes. It also integrates seamlessly into VEECO process tools including Molecular Beam Epitaxy (MBE), Atomic Layer Deposition (ALD), and Chemical Mechanical Polishing (CMP). V 200SI model is one of the most advanced test/probe platforms on the market. Its combination of metrology and electrical test capabilities provides the best performance and accuracy for a wide array of semiconductor process and test applications. It is the ideal platform for production-level wafer testing and metrology needs.