Used VEECO / DIGITAL INSTRUMENTS Dimension VX 210 #9036448 for sale

ID: 9036448
Wafer Size: 8"
Vintage: 2001
Atomic force profiler, 8" 2001 vintage.
VEECO / DIGITAL INSTRUMENTS Dimension VX 210 is a state-of-the-art wafer testing and metrology equipment that can be used to accurately measure and characterize semiconductor wafers for a variety of applications. This highly reliable system offers unprecedented accuracy and precision, allowing users to quickly and accurately verify results. The VX 210 features a multi-sensor array that allows users to monitor thin film thickness, surface topography, electrical characteristics, and other critical characteristics of semiconductor wafers. The VX 210 utilizes advanced imaging and spectroscopy techniques to provide comprehensive analyses of wafers. The imaging capabilities allow the unit to identify differences in topography, porosity, feature sizes, and more. Spectroscopy techniques enable the machine to measure the optical, electrical, and other characteristics of the wafers. The multi-sensor array allows users to analyze a wide range of wafer properties in detail, including: Surface topography Film electrical properties Film thickness and composition Feature size and pattern uniformity Layer defect and contamination levels The VX 210 provides a range of automated data analysis and reporting features that enable users to quickly and accurately characterize wafers. The integrated software interface features wafer mapping, extensive analysis tools, full data signoff, and automated reporting. The tool also supports advanced data storage and transfer, allowing users to export data sets for further analysis or archiving. VEECO Dimension VX 210 is an excellent choice for a wide range of wafer testing and metrology applications. This asset offers users the ability to quickly and accurately evaluate wafer properties and provide reliable results in a cost-effective package. With its advanced imaging and spectroscopy capabilities, the VX 210 is ideal for semiconductor process control, research, and development applications.
There are no reviews yet