Used VEECO / DIGITAL INSTRUMENTS Dimension VX 210 #9043313 for sale
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VEECO / DIGITAL INSTRUMENTS Dimension VX 210 Wafer Testing and Metrology System with Light-Enhanced Measurement (LEM)TM Technology is an AFM that provides unmatched throughput and performance for advanced process and metrology application. VEECO Dimension VX 210 is designed to handle both planar and vertical wafer-level dicing and metrology requirements for low (<100) to mid-volume (<3K) production. DIGITAL INSTRUMENTS DIMENSION VX210 features advanced digital capability to give superior image clarity even in ambient light conditions. Its patented light-enhanced imaging (LEM)TM enables high quality imaging without the use of bulky optical fibers and lasers. DIMENSION VX210 has a fast scan rate and uses vibration isolation for excellent image clarity. VEECO / DIGITAL INSTRUMENTS DIMENSION VX210 is suitable for a variety of high performance measurement applications including advanced characterization of semiconductor dies, stacked die measurements, layer thickness measurements, imaging of local hybridization techniques, as well as a range of other wafer metrology requirements. DIGITAL INSTRUMENTS Dimension VX 210 supports a wide range of sample types including crystalline and amorphous silicon, compound semiconductors, layered materials, silicone, quartz, and other films and substrates. It is the preferred choice for processes such as MEMS, HBLED, laser lift-off, through-silicon-via (TSV), and mobile 3D stacking applications. Dimension VX 210 also features a heavy-duty servo motor-controlled zoom and descan deck to allow fast and accurate insertion and removal of wafers. The VX210's low profile and robust design ensures reliable operation in harsh production environments. Thanks to its high speed scanning, superb image clarity, vibration isolation, and heavy-duty deck, VEECO DIMENSION VX210 provides the ultimate in wafer production throughput and performance. With VEECO / DIGITAL INSTRUMENTS Dimension VX 210, research facilities and OEMs can increase productivity and ensure accurate, repeatable results for their most demanding applications.
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