Used VEECO / DIGITAL INSTRUMENTS Dimension VX 340 #9270545 for sale

VEECO / DIGITAL INSTRUMENTS Dimension VX 340 equipment is a wafer testing and metrology system designed to enable high-speed, high-accuracy measurements of critical wafer properties. The unit offers advanced features such as 4-tile architecture, environmental control, extended visible wavelength, and high-fidelity beam steering for improved throughput and performance. The machine employs an integrated 4-tile design, which allows wafers to be placed in multiple passes, enabling high-speed wafer testing. This feature also reduces the dependence on a single wafer type or single pass sequence, leading to a more efficient lithography process due to improved accuracy and repeatability. The tool is also equipped with a dynamic beam steering feature, providing high-accuracy beam positioning without random errors. It is compatible with a wide range of wafer sizes and materials, and can measure features at any depth on the wafer, enabling high-accuracy metrology of the complete device. In addition, the asset features an advanced environment control model for controlling temperature and humidity in the environment around the wafer to ensure consistent results. The equipment also offers an automated tuning system, which enables the unit to quickly adjust to wafer disturbances and conform to exacting surface measurements with high precision. The VX 340 machine is also equipped with an integrated extensible visible wavelength tool, which enables high-resolution characterization of metrology and test results. This is achieved through advanced software algorithms, allowing the asset to select and optimize the best image capture parameters for each sample. Finally, the model employs a range of user-friendly features to minimize operator interference, while also increasing throughput. With the user-friendly graphical user interface and intuitive measurement capabilities, VEECO Dimension VX 340 equipment is an ideal solution for high-performance wafer testing and metrology.