Used VEECO / DIGITAL INSTRUMENTS Dimension VX 340 #9286899 for sale

VEECO / DIGITAL INSTRUMENTS Dimension VX 340 is an advanced, automated wafer testing and metrology equipment designed to meet the needs of both production and research & development laboratories. This system is designed to handle a wide variety of wafer sizes and process flows, from multi-DOF metrology to a broad range of process testing applications requiring multiple axes and multiple outcomes. VEECO Dimension VX 340 is specifically designed for nanoscale research. It features a 0.3nm repeatability stage with nanometer-level stage scaling accuracy, enabling researchers to accurately measure features within nanometer level measurement uncertainties. It is also equipped with a TEM surface area detector that provides spectral sensitivity to measure across a wavelength range from UV to infrared. DIGITAL INSTRUMENTS Dimension VX 340 offers an optional thermoelectric AC-DC bias generator for measuring electrical properties of wafers that require multiple bias levels. Additionally, the unit includes both CCD and EDX (energy dispersive X-ray spectroscopy) sensors for in-situ metrology and analysis. The CCD is used for imaging and the EDX is used for elemental or cultural analysis. The machine is capable of measuring various properties of a device such as surface roughness, toughness, wear, thermal conductivities, etc. It is equipped with a chuck and sample load station that support the automated process of transferring wafers from the loader station to the stage and then back after the measurements have been completed. In addition, Dimension VX 340 also offers a comprehensive suite of software and hardware features. The multilayered software provides full support for industrial automation, monitoring, and reporting, enabling users to efficiently and accurately process wafers with minimal training and experience. The user-friendly graphical user interface (GUI) completes the tool and maximizes user productivity by enabling users to rapidly change settings and capture data in a visualized format. The GUI provides the user with tools for data analysis, visualization, and report generating that enhance the user's insight into the data collected from the asset. Overall, VEECO / DIGITAL INSTRUMENTS Dimension VX 340 is a robust, highly automated wafer testing and metrology model that provides researchers with a comprehensive array of automated features, as well as the power to measure nanometer-level features with high accuracy.