Used VEECO / DIGITAL INSTRUMENTS VX 210 #9097586 for sale

VEECO / DIGITAL INSTRUMENTS VX 210 is a state-of-the-art wafer testing and metrology equipment designed to meet the most demanding applications in advanced semiconductor processing and device characterization. VEECO VX 210 is capable of providing precise measurements of surface topography, electrical, optical, thermal, and straining characteristics of a variety of substrates. DIGITAL INSTRUMENTS VX 210 is equipped with an integrated structural scanning microscope (SSM) which is capable of providing high resolution images of a range of sample surfaces. It features sample stage assemblies that are easy to configure, allowing for accurate positioning of substrates. Additionally, VX 210 is built with comprehensive software that allows for the capture, analysis, and comparison of surface features such as surface roughness, step heights, pattern size, and pattern location. VEECO / DIGITAL INSTRUMENTS VX 210's electrical metrology capabilities make it ideal for the characterization of device structures and interconnects. Its integrated electrical characterization system is capable of monitoring complex electrical responses of a range of test structures and analyzing characteristics such as frequency response, impedance, voltage gain, and package leakage. Additionally, VEECO VX 210 has a wide range of optical metrology packages that are capable of measuring the optical reflectivity, transmission, and absorption of samples. Finally, DIGITAL INSTRUMENTS VX 210 features an innovative three-axis thermal probe for measuring the thermal resistance of various materials, as well as a unique straining unit that is capable of monitoring specimen deformation in real-time. The three-dimensional scanning capabilities of VX 210 make it an ideal machine for applications such as MEMS (microelectromechanical systems) testing and monitoring the development of physical and chemical processes. VEECO / DIGITAL INSTRUMENTS VX 210 wafer testing and metrology tool is the ideal solution for meeting the most challenging semiconductor characterization needs. Its extensive range of integrated metrology packages, combined with its highly accurate imaging capabilities and real-time monitoring functions, make it a powerful tool for various advanced metrology tasks.