Used VEECO Profilometer #293671953 for sale

VEECO ProFiler is a wafer testing and metrology system designed to measure parameters of high-end semiconductor chips, such as surface geometry, crystallographic orientation, defect size, doping, and depth. Utilizing the latest in automation and digital imaging technologies, the ProFiler provides a wide range of metrology capabilities at the highest user comfort levels. The ProFiler enables non-destructive evaluation of wafers from the most complex chips to simple MEMS structures. VEECO ProFiler uses interchangeable scanning probes that are highly accurate and sensitive enough to detect any irregularities in electrical, material, and physical properties. ProFiler can scan up to 4-inch and 6-inch wafers using patented multiple-pointer zoom capability that can measure parameters to a nanometer resolution. Additionally, the integrated X-Y computer-controlled stage provides fully automated performance with MicronStep, a feature that reduces the complexity of non-linear motion during measurements. The ProFiler's CCD digital image in transmitter makes use of scattered light to study microstructures instead of mapping topographical features. It can be used to detect features such as nanoscale 3D structures and areas with light scattering due to electrical discontinuities. This helps to distinguish between adjacent structures, flaws, and defects under the same boundaries quickly and accurately. This helps to provide precise measurements for probing (etching) and modification (texturing). VEECO ProFiler's user-friendly interface features an intuitive graphical user interface (GUI), allowing the user to quickly set up a measurement. It also includes comprehensive data analysis capabilities, allowing users to study and evaluate data collected through wafer testing. In summary, VEECO ProFiler is a highly accurate and sensitive wafer testing and metrology system that can be utilized to measure parameters of high-end semiconductor chips. It utilizes interchangeable scanning probes, X-Y computer-controlled stage, CCD digital image in transmitter, and a user-friendly GUI to provide precise measurements for probing and modification. Additionally, the ProFiler includes comprehensive data analysis capabilities helping to study and evaluate data collected through wafer testing.