Used VEECO V200-Si #9235749 for sale

Name: VEECO V200-Si
Brand: VEECO
SKU: 9235749
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Wafer Testing And Metrology

Manufacturer

VEECO

Model

V200-Si

ID: 9235749

Surface profiler N2 and CDA: Standard quick connects 7 mm tube Exhaust: General exhaust, 125 mm Communication: Standard printer port Standard monitor port Operating system: Windows 98 Second edition Processor: Pentium (r), 32.0 MB RAM Vertical range: Up to 262 µm Vertical resolution (At various ranges): 1Å/65K Å, 10 Å/655K Å, 40 Å/2620K Å Scan length: 50 µm to 200 mm Scan speed ranges: 3 to 218 Seconds Stage leveling: Automatic & power leveling Stylus: Diamond, 5 µm radius Stylus tracking force: Programmable, <1-30 mg Max sample thickness: 45 mm Sample stage diameter, 8" Sample stage translation: X Axis: 200 mm Y Axis: 200 mm Sample stage rotation: Θ 360° Magnification: 60x to 420x Standard power: 240 V, 10 A.

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VEECO V200-Si Wafer Testing and Metrology equipment is a compact, cost-effective solution for measuring the critical performance parameters of semiconductor wafers during production. It uses software-controlled optics to measure the topography, thickness, and uniformity of the wafer's surfaces. The system also provides a range of analysis features to ensure that the wafer meets the desired specifications. VEECO V 200SI features an incredibly accurate scanning and measurement unit, allowing users to quickly and easily analyze the wafer's characteristics. The machine provides a resolution of 0.3 micron and a measuring range up to 26mm x 26mm. The microscope has an optical zoom of up to 1000 times and a large field of view that allows for a larger field of view while keeping the details of individual device features intact. VEECO tool makes use of a variety of software-controlled metrology methods, including contact scanning, non-contact scanning, and spectroscopic methods. These techniques enable the user to measure heights of features and generate data points for review. The software also provides a range of data analysis solutions, from automatic digitization of topography data to surface roughness assessment. V200 SI also includes a user-friendly, intuitive graphical interface and advanced computing resources, enabling users to quickly and easily analyze data and create comprehensive engineering reports. Additionally, users can monitor, analyze, and optimize wafer performance in real-time, helping them to ensure consistent quality throughout the production process. Overall, DEKTAK V-200 SI Wafer Testing and Metrology Asset provides a highly sophisticated, and convenient solution for automated wafer testing and metrology. Its accurate measurement and analysis capabilities, coupled with its intuitive graphical user interface, make it an ideal choice for high-accuracy wafer inspection operations. Additionally, VEECO post-sales technical support and training programs ensure that users can get the most out of their model and achieve the highest levels of accuracy and throughput in the production process.