Used VEECO V200-Si #9235992 for sale

VEECO / DEKTAK V200-Si is a precision wafer testing and metrology equipment designed to measure layers of semiconductor chips for thickness, flatness, and other microstructural features. The system utilizes advanced optical sensing technology to measure and analyze the surface topography of a wafer, making it an ideal tool for research and production in the semiconductor industry. VEECO V 200SI's optical sensing technology utilizes two types of scanners: an ultra-compact scanning mirror and a low-profile scanning mirror. The ultra-compact scanning mirrors are designed to accurately capture the topography of high roughness sites, while the low-profile scanning mirrors provide higher precision measurements of low roughness sites. The data from the scans is used to create a 3D topographic map of the wafer surface, which can be used to analyze the surface features, such as grain size, crystalline structure, and other microstructural defects. DEKTAK V200 SI unit also includes software for automated data processing and analysis. The software allows the user to create custom measurements for measuring specific microstructural features within the wafer. The software also automates the entire metrology process, making it easier and more efficient for the user. Additionally, DEKTAK V- 200 SI is programmed with a universal language interface to ensure that the data is easily understood and applied to other systems. DEKTAK V200-Si also features a variety of accessories which can enhance the precision of the measurements. These accessories include a variable-sized scanner, a temperature-stabilized stage, and a fiber optic cable. The variable-sized scanner can be adjusted to measure different size wafers, while the temperature-stabilized stage ensures accurate readings in both warm and cold environments. The fiber optic cable allows data to be transferred at high speeds between the wafer and the workstation. DEKTAK V 200SI is an advanced wafer testing and metrology machine designed for precise measurement and analysis of semiconductor layers. Its high-precision optical scanning technology and automated data processing and analysis software make it an ideal tool for measuring and analyzing microstructural features within the wafer. Furthermore, its accessories make the tool capable of handling a wide range of wafer sizes and temperatures. VEECO / DEKTAK V- 200 SI is a powerful and reliable tool for research and production in the semiconductor industry.