Used VEECO V200-Si #9254651 for sale

VEECO V200-Si is a wafer testing and Metrology instrument ideal for monitoring the characteristics of semiconductors during the manufacturing process. It has been designed to handle both front- and back-side wafers up to 200mm in size. The equipment provides the precision necessary to accurately measure dopant concentrations and layer thicknesses in a thin-film deposition process. The system features a variety of detection technologies to capture data on the wafer surface, including atomic force microscopy (AFM), electrical capacitance measurements (ECM), and electron energy loss spectroscopy (EELS). With the AFM option, VEECO V 200SI can acquire surface topography information as well as detailed images of surface features. The ECM and EELS systems are combined with the AFM to provide a comprehensive set of measurements that allow for the analysis of wafer features down to nanometer-level resolution. V200 SI also includes analysis and metrology software, which simplifies the data-analysis process. This software enables users to quickly and accurately measure and characterize the properties of thin films. The software can also be used to generate a variety of two and three-dimensional charts for graphing process data and tracking wafer performance over time. The unit is compatible with a range of sample handling systems, making it easy to integrate DEKTAK V-200 SI into a production line. The instrument is also equipped with safety interlocks and automatic calibration features to ensure proper operation and consistent results. Additionally, VEECO DEKTAK V-200 SI can be operated remotely, allowing users to quickly adjust settings and parameters without having to be in the lab. In summary, VEECO V- 200 SI is an advanced wafer testing and metrology machine capable of accurately measuring dopant concentrations, layer thicknesses, and surface topographies. It is designed to provide reliable data for semiconductor manufacturing processes, and its safety features, compatibility with sample-handling systems, and remote operation capabilities make it the ideal tool for wafer testing and metrology.