Used VIEW ENGINEERING / GSI LUMONICS 880-200 #124443 for sale
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In-tray lead / bump inspection system Measures: QFP, TQFP, TSOP, BGA, and CSP devices 115V, 10A.
VIEW ENGINEERING / GSI LUMONICS 880-200 is a state-of-the-art wafer testing and metrology equipment designed to help process engineers ensure the quality of their products. It measures, inspects, and verifies the quality of components on wafer substrates and other technical substrates. GSI LUMONICS 880-200 is a precision tool used to check the quality of components on wafer substrates. It features an XYZ imaging system, with a move range of 25mm, 50mm and 50mm respectively. The imaging unit offers a 25x microscope with 0.5um resolution, which is suitable for inspecting advanced technology components and designs. The imaging machine has a high scanning speed, making it suitable for automated inspection of large areas of a wafer substrate. VIEW ENGINEERING 880-200 is equipped with a range of automated analysis tools, which can quickly and accurately analyze features on a wafer substrate. These tools include 2D image analysis, 3D image analysis, reflectometric analysis, scatterometry, parametric characterization, and feature recognition. This powerful suite of tools enables 880-200 to identify and correct variances in component formation, shape, and size. VIEW ENGINEERING / GSI LUMONICS 880-200 is designed to be easily integrated into existing production lines. It supports RS-232 and Ethernet-based communication, allowing engineers to remotely operate and troubleshoot the tool from their desks. Additionally, it can be easily connected to other wafer inspection systems and measurement equipment in order to allow for easy data comparison and analysis. GSI LUMONICS 880-200 is a powerful and reliable wafer testing and metrology asset. Its array of automated analysis tools, wide range of imaging capabilities, and easy integration into existing production lines make it suitable for process engineers, ensuring the quality of their products.
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