Used WENTWORTH 0-021-0200 #293634266 for sale

WENTWORTH 0-021-0200 is a wafer testing and metrology equipment designed for semiconductor device and wafer-level characterization of silicon and compound semiconductor devices and MEMS. This advanced metrology system is capable of performing various types of tests and measurements with precision and accuracy. 0-021-0200 is composed of a multi-stage, multi-axis sample stage, and a high-resolution overlay measurement unit that accurately measures a number of device parameters, such as dielectric constants, gate capacitance, gate-to-drain capacitance, and other parametric performance. The machine includes a comprehensive suite of measurement tools, including a CCD microscope, digital imaging software, a thermally-controlled environment chamber, and precise sample tracking and analysis software. WENTWORTH 0-021-0200 offers accurate and precise testing of a broad range of advanced semiconductor device structures, including finFET, FD-MOSFET, III-V, and Micro Electro Mechanical Systems (MEMS) architectures. The tool is equipped with up to 32 alignment stages, 9-axis motion control, high-precision stages and load cells with high force resolution, fast sample mounting options and a wide range of optical metrology accessories for a variety of testing tasks. 0-021-0200 employs high accuracy, high-speed scanning interferometric technology combined with optical image processing, allowing for sub-nm resolution measurements. The asset offers repeatable measurements and dynamic range in the range of 0.3 to 50.2 microns, verifying wafer-level device designs and construction. WENTWORTH 0-021-0200 is designed for fast and accurate testing in environments ranging from research and engineering to production metrology. The model offers a wide range of advanced error detection, including integrated data logging and analysis software, with automated test scheduling and report generation. 0-021-0200 provides a complete suite of testing capabilities, enabling engineers, researchers, and production personnel to quickly verify the structural integrity and thermal behavior of semiconductor and MEMS-based devices. This advanced wafer testing and metrology equipment is capable of exceeding the accuracy and precision requirements of today's new and emerging wafer-level structures, offering reliable and repeatable characterization across a broad range of IC materials and devices.