Used WIS INC PDS 1020-G2 #9258990 for sale

WIS INC PDS 1020-G2 wafer testing and metrology equipment is a precision analytical tool designed for semi-automated inspection and categorization of both integrated circuit (IC) and compound semiconductor wafers. This system is capable of performing both contact resistance and optical microscopy (OM) testing, making it an ideal solution for device and power performance analysis. PDS 1020-G2 includes a glass-tube optical microscope equipped with an automated light source, motorized stage, high-resolution digital imaging unit, and a hardware-selectable integrated vision machine. The digital imaging tool utilizes a 10 megapixel CCD image sensor to capture digital images of wafer surfaces at magnifications up to 500x. The integrated vision asset includes advanced image processing algorithms to accurately detect defects and perform measurements on captured images. The model also features a precision ultrasonic probe station and high-accuracy motion control equipment, allowing for integrated resistance measurements of specimen points. The ultrasonic probe station is capable of acquiring resistances up to 10GHz, while the motion control system quickly moves the probe between measurement points for accurate resistance mapping. A sample holder platform is also included to securely hold the wafers in place during testing. In addition to physical testing, WIS INC PDS 1020-G2 includes on-board software for data management and data presentation. This unit supports both 2D and 3D plots to give a comprehensive overview of the wafer's performance, as well as a feature which enables the user to compare multiple setups and make judgements on optimal test configurations. Furthermore, sophisticated post-analysis utilities are included to more accurately decipher the test results. PDS 1020-G2 is a compact, easy-to-use wafer testing and metrology machine suitable for a variety of semiconductor applications, from IC development to process quality optimization. Its easy operation, high accuracy, and comprehensive software capabilities make it an ideal solution for device and power performance analysis.