Used WYKO NT 8000 #9302479 for sale
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ID: 9302479
Vintage: 2005
Optical profiler
With BASLER A311f camera
Objectives: 5x and 50x
Galil controller
With DELL G7 computer
Operating system: Windows XP
2005 vintage.
WYKO NT 8000 is a powerful wafer testing and metrology equipment that provides high accuracy and speed. It is a proven non-contact optical system that uses "dark field" imaging technology to quickly measure a wide variety of features on the wafer including surface topography, step heights, particle size, and defect size. The unit's unique design includes an advanced CCD camera on a precision positioning stage, along with a high-power digital signal processor (DSP) for controlling imaging and motion. The DSP automatically adjusts the camera's gain and exposure settings during imaging, ensuring accurate measurements of the wafer features. NT 8000 also features a unique auto-focus capability that minimizes focus errors and optimizes scan speed and accuracy. WYKO NT 8000 is capable of measuring a variety of wafer geometries, including pad topography, gate sidewall angles, indentations, and slot depths. It is also capable of simultaneously measuring multiple feature types in a single scan. This allows for a fast, efficient process that yields highly accurate results. This machine has excellent repeatability and is designed to provide maximum throughput and accuracy. It supports a variety of measurement conditions such as different levels of zoom and image resolution for enhanced accuracy. It is also equipped with a wide range of specialized optics, accessories, and options that allow it to measure a range of features and geometries on the wafer. In addition to wafer metrology, the tool can also automate micro-pattern feature generation. It is also a great solution for inspecting non-flat substrates such as lenses, glass, and AlN wafers. Overall, NT 8000 wafer testing and metrology asset is an advanced optoelectronic model that provides fast, high-accuracy measurements of wafer features. Its versatile design allows for simultaneous measurement of multiple feature types, as well as for automated micro-pattern generation. With its industry-proven performance and user-friendly interface, WYKO NT 8000 is an ideal solution for various inspection and metrology applications.
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