Used WYKO / VEECO 3306 #293650078 for sale

WYKO / VEECO 3306 is a high-performance wafer testing and metrology equipment that offers superior accuracy and performance when it comes to controlling and measuring the physical attributes of all semiconductor wafers. This system measures the various characteristics of wafers, such as patterned lines, as well as analyzing the optical properties and image resolution. WYKO 3306 unit consists of several components, which include optics, detectors, XYZ stages and other associated electronics. The optics used by the machine are achromatic and telecentric, delivering the best possible image quality that ensures repeatable and accurate measurements. The detectors and XYZ stages mounted on the machine are both highly accurate and precision-engineered, helping to guarantee the accuracy of the tool as a whole. The technique used for wafer testing/measurement is one that is based on scatterometry, which is a form of light diffraction. VEECO 3306 can measure the line widths for design layers, as well as structural features, scan area and more on sample wafers. The asset can also verify the quality of etch process results by measuring non-visible features on the wafer after processing finishes. The model can precisely measure the depth of structures on the sample, as well as the sidewall angle and profile of the structures, thus enabling users to accurately predict how their design results will be. 3306 is capable of automatically identifying defects as small as two to three pixels, ensuring the best possible quality when it comes to testing and metrology. It is also capable of measuring 3D structure information, such as step heights, profiles, and image intensity variations. WYKO / VEECO 3306 is a highly versatile wafer testing and metrology equipment capable of delivering superior accuracy and performance when it comes to controlling and measuring physical attributes of all semiconductor wafers. This system offers a great solution for users who need to accurately measure, analyze, and verify the quality of their wafers.