Used WYKO / VEECO 400 #9184890 for sale

WYKO / VEECO 400 is a wafer testing and metrology equipment used for the analysis and characterization of semiconductor wafers. It is a high speed system that is capable of testing both wafer-level and device-level capacitance and resistance. The unit's core module is its four-zone scanning optical microscope, which is a modular, variable-field-of-view device permitting the viewing of multiple wafers on a single microscope. The microscope has an automated image capture and analysis capability, enabling the rapid analysis of multiple wafers with accurate, precise results. Additionally, WYKO 400 machine includes a resistivity metrology tool which provides in-depth analysis of conductors and dielectrics at the wafer-level. Furthermore, the tool is capable of measuring wafer parameters such as resistivity, thickness, temperature, and electrical characteristics including capacitance and resistance. VEECO 400 provides a wide range of technological features that permit it to accurately and efficiently analyze the electrical properties of different types of devices and materials. The asset includes an automated value adjustment, high-speed receiver, pattern recognition algorithms, an integrated library of testing functions and results, as well as a printer and data storage model. The combination of these features makes 400 Wafer Testing and Metrology Equipment a reliable and efficient tool for both wafer and device characterization. The user-friendly interface gives users the ability to quickly set up and run tests, analyze results, and store them in either a web-based database or a local file. Additionally, the system is also capable of running multiple tests simultaneously with the capability of monitoring progress and results from all tests simultaneously. In summary, WYKO / VEECO 400 Wafer Testing and Metrology Unit offers a high speed, reliable and efficient way of testing and characterizing wafers and devices. It has a number of features such as pattern recognition algorithms, automated value adjustment, an integrated library of testing functions, and data storage systems, making it a valuable tool for many applications.