Used WYKO / VEECO 400 #9184891 for sale

WYKO / VEECO 400 is a wafer testing and metrology equipment specifically designed to provide comprehensive analysis of both single-wafer and batch-wafer applications. By using digital imaging and specialized software, the system is able to provide accurate and reliable measurements of both physical and electrical properties of the wafers in question. The main components of WYKO 400 include a Video-Based Imaging Unit, an Automated Prober, a Metrology Station and a Calibration/Software Machine. The Video-Based Imaging Tool takes image data from either a CCD camera or laser scatter-meter, and transfers it to a dedicated computer for additional processing and evaluation. This asset is designed for maximum precision and accuracy in the analysis of features, such as etch thickness and topography. The Automated Prober enables VEECO 400 to probe up to 100,000 sites for conducting electrical test measurements per hour. The Metrology Station provides a range of powerful tools for accurate wafer geometry determination and surface characterization. Finally, the Calibration/Software Model includes a suite of programs to facilitate the calibration process, as well as to simplify data management and analysis. 400 is highly modular and customizable; it can be configured to fit specific needs, such as the processing of larger wafers or the automation of an entire testing process. This equipment also features several specialized add-on options that can enhance its capabilities and the accuracy of analysis. These include an automated sample changer, a higher resolution CCD camera, and programs that can be used to control the size and shape of probes. WYKO / VEECO 400 is designed to provide reliable, accurate, and repeatable measurements, even in harsh or difficult environments. It is capable of scanning wafers from 15 to 300mm in diameter, offers a variety of electrical testing options, and is compatible with a wide range of data acquisition and analysis software. Its modular design and powerful features make it an ideal solution for a variety of complex wafer testing and metrology tasks.